Full information acquisition in piezoresponse force microscopy
- Somnath, Suhas | Oak Ridge National Laboratory
- Belianinov, Alexei | Oak Ridge National Laboratory
- Kalinin, Sergei V | Oak Ridge National Laboratory
- Jesse, Stephen | Oak Ridge National Laboratory
Overview
Description
Raw measurement data corresponding to the following journal publication: Full information acquisition in piezoresponse force microscopy Suhas Somnath, Alexei Belianinov, Sergei V. Kalinin, and Stephen Jesse Appl. Phys. Lett. 107, 263102 (2016); https://doi.org/10.1063/1.4938482
Funding resources
DOE contract number
DEAC0500OR22725Originating research organization
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)Sponsoring organization
Office of Science (SC), Advanced Scientific Computing Research (ASCR) (SC-21)Related resources
- IsSupplementTo (DOI): https://doi.org/10.1063/1.4938482
Details
DOI
10.13139/OLCF/1464456Release date
August 14, 2018Dataset
Dataset type
ND Numeric DataSoftware
HDF5 driversAcknowledgements
Users should acknowledge the OLCF in all publications and presentations that speak to work performed on OLCF resources:
This research used resources of the Oak Ridge Leadership Computing Facility at the Oak Ridge National Laboratory, which is supported by the Office of Science of the U.S. Department of Energy under Contract No. DE-AC05-00OR22725.
Category
- 36 MATERIALS SCIENCE,
- 77 NANOSCIENCE AND NANOTECHNOLOGY,
- 97 MATHEMATICS AND COMPUTING
Keywords
- Scanning Probe Microscopy General Mode Piezoresponse Force Microscopy