Full information acquisition in piezoresponse force microscopy

10.13139/OLCF/1464456

Raw measurement data corresponding to the following journal publication: Full information acquisition in piezoresponse force microscopy Suhas Somnath, Alexei Belianinov, Sergei V. Kalinin, and Stephen Jesse Appl. Phys. Lett. 107, 263102 (2016); https://doi.org/10.1063/1.4938482

Published: 2018-08-14 10:54:04 Download Dataset

Dataset Properties

Field Value
Authors
  • Somnath, Suhas Oak Ridge National Laboratory
  • Belianinov, Alexei Oak Ridge National Laboratory
  • Kalinin, Sergei V Oak Ridge National Laboratory
  • Jesse, Stephen Oak Ridge National Laboratory
Project Identifier STF011
Dataset Type ND Numeric Data
Subjects
  • 36 MATERIALS SCIENCE
  • 77 NANOSCIENCE AND NANOTECHNOLOGY
  • 97 MATHEMATICS AND COMPUTING
Keywords
  • Scanning Probe Microscopy General Mode Piezoresponse Force Microscopy
Software Needed HDF5 drivers
Originating Organizations Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organizations Office of Science (SC), Advanced Scientific Computing Research (ASCR) (SC-21)
DOE Contract DEAC0500OR22725
Related Identifiers
  • IsSupplementTo (DOI) 10.1063/1.4938482

Acknowledgements

Papers using this dataset are requested to include the following text in their acknowledgements:

*Support for 10.13139/OLCF/1464456 is provided by the U.S. Department of Energy, project STF011 under Contract DEAC0500OR22725. This research used resources of the Oak Ridge Leadership Computing Facility, which is a DOE Office of Science User Facility.