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Full information acquisition in piezoresponse force microscopy

  • Somnath, Suhas | Oak Ridge National Laboratory
  • Belianinov, Alexei | Oak Ridge National Laboratory
  • Kalinin, Sergei V | Oak Ridge National Laboratory
  • Jesse, Stephen | Oak Ridge National Laboratory
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Overview

Description

Raw measurement data corresponding to the following journal publication: Full information acquisition in piezoresponse force microscopy Suhas Somnath, Alexei Belianinov, Sergei V. Kalinin, and Stephen Jesse Appl. Phys. Lett. 107, 263102 (2016); https://doi.org/10.1063/1.4938482

Funding resources

DOE contract number

DEAC0500OR22725

Originating research organization

Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring organization

Office of Science (SC), Advanced Scientific Computing Research (ASCR) (SC-21)

Related resources

Details

DOI

10.13139/OLCF/1464456

Release date

August 14, 2018

Dataset

Dataset type

ND Numeric Data

Software

HDF5 drivers

Acknowledgements

Users should acknowledge the OLCF in all publications and presentations that speak to work performed on OLCF resources:

This research used resources of the Oak Ridge Leadership Computing Facility at the Oak Ridge National Laboratory, which is supported by the Office of Science of the U.S. Department of Energy under Contract No. DE-AC05-00OR22725.

Category

  • 36 MATERIALS SCIENCE,
  • 77 NANOSCIENCE AND NANOTECHNOLOGY,
  • 97 MATHEMATICS AND COMPUTING

Keywords

  • Scanning Probe Microscopy General Mode Piezoresponse Force Microscopy