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Full information acquisition in piezoresponse force microscopy

    Suhas Somnath | Oak Ridge National Laboratory
    Alexei Belianinov | Oak Ridge National Laboratory
    Sergei V Kalinin | Oak Ridge National Laboratory
    Stephen Jesse | Oak Ridge National Laboratory
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Description

Raw measurement data corresponding to the following journal publication: Full information acquisition in piezoresponse force microscopy Suhas Somnath, Alexei Belianinov, Sergei V. Kalinin, and Stephen Jesse Appl. Phys. Lett. 107, 263102 (2016); https://doi.org/10.1063/1.4938482

Funding Information

DOE Contract Number

DEAC0500OR22725

Originating Research Organization

Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization

Office of Science (SC), Advanced Scientific Computing Research (ASCR) (SC-21)

Related Works

Details

DOI

https://doi.org/10.13139/OLCF/1464456

Release Date

August 14, 2018

Subject

36 MATERIALS SCIENCE, 77 NANOSCIENCE AND NANOTECHNOLOGY, 97 MATHEMATICS AND COMPUTING

Keywords

Scanning Probe Microscopy General Mode Piezoresponse Force Microscopy

Dataset

Dataset Type

ND Numeric Data

Software

HDF5 drivers

Cite This Dataset:

Somnath, S., Belianinov, A., Kalinin, S., Jesse, S. (2018). Full information acquisition in piezoresponse force microscopy. Oak Ridge National Laboratory. https://doi.org/10.13139/OLCF/1464456.

Acknowledgements

This research used resources of the Oak Ridge Leadership Computing Facility at the Oak Ridge National Laboratory, which is supported by the Advanced Scientific Computing Research programs in the Office of Science of the U.S. Department of Energy under Contract No. DE-AC05-00OR22725.